Close Menu
    Facebook X (Twitter) Instagram
    Trending
    • US storm leaves 670,000 without power, forces thousands of flight cancellations
    • Pentagon downplays China threat: What it means for US allies | Explainer News
    • Three sneaky-good moves the Yankees should make to shake up their roster
    • Column: Why MacGyver never carried a gun: The LAPD officer who transformed TV policing
    • What we know about the latest Minneapolis shooting by federal agents
    • Crippling power outage ends in Greenland capital
    • Israeli forces kill Palestinian man in occupied West Bank | Israel-Palestine conflict News
    • Team USA’s Olympic hockey decisions continue to look worse
    Prime US News
    • Home
    • World News
    • Latest News
    • US News
    • Sports
    • Politics
    • Opinions
    • More
      • Tech News
      • Trending News
      • World Economy
    Prime US News
    Home»Tech News»Configuring and controlling complex test equipment setups for silicon device test and characterization
    Tech News

    Configuring and controlling complex test equipment setups for silicon device test and characterization

    Team_Prime US NewsBy Team_Prime US NewsSeptember 25, 2025No Comments1 Min Read
    Share Facebook Twitter Pinterest LinkedIn Tumblr Reddit Telegram Email
    Share
    Facebook Twitter LinkedIn Pinterest Email

    On this webinar, we are going to discover environment friendly, correct, and scalable strategies for analog and mixed-signal system testing utilizing reconfigurable check setups. As semiconductor units develop extra complicated, engineers face the problem of validating efficiency and catching edge instances beneath tight schedules. Check setups usually embody oscilloscopes, waveform turbines, community analyzers, and extra, doubtlessly from completely different distributors with distinctive automation and configuration issues. With a purpose to hold tempo with semiconductor validation necessities, multi-channel check setups designed for flexibility and efficiency may also help engineers scale successfully.

    Key learnings:

    • Decreasing sign path complexity with a number of built-in devices
    • Bettering information constancy when measuring mixed-signal DUT response
    • Constructing environment friendly parallel check setups to extend throughput
    • Configuring instance check setups for widespread semiconductor validation assessments



    Source link

    Share. Facebook Twitter Pinterest LinkedIn Tumblr Email
    Previous ArticleMarket Talk – September 25, 2025
    Next Article Parents of girl still missing from Camp Mystic flooding calls reopening of camp ‘unthinkable’
    Team_Prime US News
    • Website

    Related Posts

    Tech News

    Project G Stereo: A 60s Design Icon

    January 24, 2026
    Tech News

    Is China quietly winning the AI race?

    January 24, 2026
    Tech News

    Robot Videos: DARPA Triage Challenge, Extreme Cold Test

    January 23, 2026
    Add A Comment
    Leave A Reply Cancel Reply

    Most Popular

    Coverting ECM Dates | Armstrong Economics

    January 5, 2026

    An orca that carried her dead calf for weeks in 2018 is doing so once again

    January 3, 2025

    Africa’s top garment exporter could fold under US tariffs, minister says

    July 12, 2025
    Our Picks

    US storm leaves 670,000 without power, forces thousands of flight cancellations

    January 25, 2026

    Pentagon downplays China threat: What it means for US allies | Explainer News

    January 25, 2026

    Three sneaky-good moves the Yankees should make to shake up their roster

    January 25, 2026
    Categories
    • Latest News
    • Opinions
    • Politics
    • Sports
    • Tech News
    • Trending News
    • US News
    • World Economy
    • World News
    • Privacy Policy
    • Disclaimer
    • Terms and Conditions
    • About us
    • Contact us
    Copyright © 2024 Primeusnews.com All Rights Reserved.

    Type above and press Enter to search. Press Esc to cancel.